This instrument measures the thermal conductivity of thin film on order of submicron deposited on a substrate from the measurement results of apparent thermal diffusivity of deposited sampling substrate and the thermal diffusivity of sampling substrate alone using the scanning laser heating AC method (Angstrom method).

The only one commercial system in the world to measure thermal conductivity of a nano thin film in normal direction.

The only one commercial system in the world to measure thermal conductivity of a nano thin film in normal direction.