About 300 thermal constant measuring systems have been installed in the field since this system was put on the market in 1970 and are highly valued for excellent performance in various fields of application. This system was standardized by the Japanese Industrial Standards (JIS R 1611-1977) as a thermal diffusivity and specific capacity measuring system for fine ceramics. It is complete with a substrate measurement attachment for a 1-inch square sample and a stepwise heating attachment for a heterogeneous compound sample.

This instrument measures the thermal conductivity of thin film on order of submicron deposited on a substrate from the measurement results of apparent thermal diffusivity of deposited sampling substrate and the thermal diffusivity of sampling substrate alone using the scanning laser heating AC method (Angstrom method).

About 300 thermal constant measuring systems have been installed in the field since this system was put on the market in 1970 and are highly valued for excellent performance in various fields of application. This system was standardized by the Japanese Industrial Standards (JIS R 1611-1977) as a thermal diffusivity and specific capacity measuring system for fine ceramics. It is complete with a substrate measurement attachment for a 1-inch square sample and a stepwise heating attachment for a heterogeneous compound sample.

This instrument is a heat flow meter type thermal conductivity measuring instrument based on the ASTM E1530 standard. It is designed for measurement of a relatively low thermal conductivity material over a temperature range from 30 to 280°C.

The only one commercial system in the world to measure thermal conductivity of a nano thin film in normal direction.

This instrument is a heat flow meter type thermal conductivity measuring instrument based on the ASTM E1530 standard. It is designed for measurement of a relatively low thermal conductivity material over a temperature range from 30 to 280°C.

This instrument measures the thermal conductivity of thin film on order of submicron deposited on a substrate from the measurement results of apparent thermal diffusivity of deposited sampling substrate and the thermal diffusivity of sampling substrate alone using the scanning laser heating AC method (Angstrom method).

About 300 thermal constant measuring systems have been installed in the field since this system was put on the market in 1970 and are highly valued for excellent performance in various fields of application. This system was standardized by the Japanese Industrial Standards (JIS R 1611-1977) as a thermal diffusivity and specific capacity measuring system for fine ceramics. It is complete with a substrate measurement attachment for a 1-inch square sample and a stepwise heating attachment for a heterogeneous compound sample.

The FTC-1 measures thermal diffusivity in the normal direction of polymer, paper and ceramic thin sheet samples using the periodical Joule heating method. It conforms to polymer film ISO 22007-3.

About 300 thermal constant measuring systems have been installed in the field since this system was put on the market in 1970 and are highly valued for excellent performance in various fields of application. This system was standardized by the Japanese Industrial Standards (JIS R 1611-1977) as a thermal diffusivity and specific capacity measuring system for fine ceramics. It is complete with a substrate measurement attachment for a 1-inch square sample and a stepwise heating attachment for a heterogeneous compound sample.

This instrument measures the thermal conductivity of thin film on order of submicron deposited on a substrate from the measurement results of apparent thermal diffusivity of deposited sampling substrate and the thermal diffusivity of sampling substrate alone using the scanning laser heating AC method (Angstrom method).

The FTC-1 measures thermal diffusivity in the normal direction of polymer, paper and ceramic thin sheet samples using the periodical Joule heating method. It conforms to polymer film ISO 22007-3.

About 300 thermal constant measuring systems have been installed in the field since this system was put on the market in 1970 and are highly valued for excellent performance in various fields of application. This system was standardized by the Japanese Industrial Standards (JIS R 1611-1977) as a thermal diffusivity and specific capacity measuring system for fine ceramics. It is complete with a substrate measurement attachment for a 1-inch square sample and a stepwise heating attachment for a heterogeneous compound sample.

This instrument measures the thermal conductivity of thin film on order of submicron deposited on a substrate from the measurement results of apparent thermal diffusivity of deposited sampling substrate and the thermal diffusivity of sampling substrate alone using the scanning laser heating AC method (Angstrom method).

About 300 thermal constant measuring systems have been installed in the field since this system was put on the market in 1970 and are highly valued for excellent performance in various fields of application. This system was standardized by the Japanese Industrial Standards (JIS R 1611-1977) as a thermal diffusivity and specific capacity measuring system for fine ceramics. It is complete with a substrate measurement attachment for a 1-inch square sample and a stepwise heating attachment for a heterogeneous compound sample.

This instrument is a heat flow meter type thermal conductivity measuring instrument based on the ASTM E1530 standard. It is designed for measurement of a relatively low thermal conductivity material over a temperature range from 30 to 280°C.

The STPM-1000 simultaneously measures the Seebeck coefficient and thermal conductivity in-plane two-dimensional distribution. Mapping analysis of materials is possible with a 20µm pitch.

This instrument measures the thermal conductivity of thin film on order of submicron deposited on a substrate from the measurement results of apparent thermal diffusivity of deposited sampling substrate and the thermal diffusivity of sampling substrate alone using the scanning laser heating AC method (Angstrom method).

The only one commercial system in the world to measure thermal conductivity of a nano thin film in normal direction.

The only one commercial system in the world to measure thermal conductivity of a nano thin film in normal direction.

The STPM-1000 simultaneously measures the Seebeck coefficient and thermal conductivity in-plane two-dimensional distribution. Mapping analysis of materials is possible with a 20µm pitch.

About 300 thermal constant measuring systems have been installed in the field since this system was put on the market in 1970 and are highly valued for excellent performance in various fields of application. This system was standardized by the Japanese Industrial Standards (JIS R 1611-1977) as a thermal diffusivity and specific capacity measuring system for fine ceramics. It is complete with a substrate measurement attachment for a 1-inch square sample and a stepwise heating attachment for a heterogeneous compound sample.